SESSION 10: SIDE CHANNELS: THE GOOD AND THE BAD

Session Chair: Fareena Saqib, Florida Institute of Technology, USA.

Wednesday May 4th, 2016 | Time: 15:20 - 16:20

  • Large Laser Spots and Fault Sensitivity Analysis**
    Falk Schellenberg, Markus Finkeldey, Nils Gerhardt, Martin Hofmann, Amir Moradi and Christof Paar - Ruhr-U. Bochum, Germany.

  • The Other Side of the Coin: Analyzing Software Encoding Schemes against Fault Injection Attacks
    Jakub Breier, Dirmanto Jap and Shivam Bhasin - Nanyang Technological U., Singapore.

  • IP Core Protection using VoltageControlled Side-Channel Receivers
    Peter Samarin, Kerstin Lemke-Rust - Bonn-Rhein-Seig U. of Applied Sciences, Germany.
    Christof Paar - Ruhr-U. Bochum, Germany.

** HOST 2016 Best Paper Nominee