Carl E. McCants

Frank McKeen

Thursday May 5th, 2016 | Time: 08:45 - 09:30

Bio: Dr. Carl E. McCants received the B.S.E. degree from Duke University, Durham, NC in 1981 and the M.S. and Ph. D. degrees from Stanford University, Stanford, CA in 1982 and 1989, respectively, all in electrical engineering. His doctoral research focused on using photoemission spectroscopy to study metal/III-V semiconductor interface development, and correlate interfacial chemistry with macroscopic electrical properties. He is currently a Program Manager at the Intelligence Advanced Research Projects Activity (IARPA) in the Office of Safe and Secure Operations, and is managing the Rapid Analysis of Various Emerging Nanoelectronics (RAVEN) program, the Circuit Analysis Tools (CAT) program and the Trusted Integrated Chips (TIC) program. From 2010 to 2012, he was a Program Manager in the Defense Advanced Research Projects Agency (DARPA) Microsystems Technology Office (MTO), focused on microelectronic integration and hardware assurance and reliability. The programs he managed included the Integrity and Reliability of Integrated Circuits (IRIS) program, the Trust in Integrated Circuits (TRUST) program, the Gratings of Regular Arrays and Trim Exposures (GRATE) program, the Leading Edge Access Program (LEAP), and the 3-Dimensional Integrated Circuits (3DIC) program.

From 2003 to 2009 he was an Associate at Booz Allen Hamilton, Arlington, VA, where he served as the Chief Technologist to the Director of the MTO Office, and Special Assistant to the Deputy Director, DARPA. From 1999 to 2003 he was a Project Manager at Agilent Technologies’ Semiconductor Products Group, San Jose, CA, where he was responsible for front-end and back-end optical and electrical characterization of VCSEL-based devices and transceivers, and automated test platform development. From 1988 to 1999 he was a Development Engineer at Hewlett-Packard’s Optical Communication Division, where he focused on III-V materials characterization, wafer fabrication and die-level photonic measurements for NIR and SWIR LEDs and lasers. Dr. McCants is a Senior Member of IEEE. He is also a member of the Board of Visitors for the Pratt School of Engineering at Duke University.

Title: From Star Trek to Star Wars: The Force Awakens - The Importance of Hardware and IP Security


The Intelligence Advanced Research Projects Activity (IARPA) is actively researching methods for hardware and intellectual property (IP) security through the Trusted Integrated Chips (TIC) Program. In this talk, I will present a perspective on IP security. Starting from an overview of IARPA, I will offer insights on future directions for IP protection using two icons from science fiction, and give a brief description of the TIC program.